Measuring negative ion yield and work function from phosphorus doped diamond, boron doped diamond, and graphite in deuterium plasmas - Institut Galilée Université Paris 13
Communication Dans Un Congrès Année : 2024

Measuring negative ion yield and work function from phosphorus doped diamond, boron doped diamond, and graphite in deuterium plasmas

Résumé

Negative-ion sources are of considerable interest for applications such as materials processing and neutral beam injection for magnetic confinement fusion. The efficient production of negative ions in these sources often relies on surface production in which positive ions from the plasma bombard the surface, capture electrons and backscatter as negative ions. Alternatively, the positive ions can be adsorbed onto the surface and subsequently sputtered as negative ions. The exposure of these surfaces to plasma at various temperatures modifies their surface state and hence, their ability to produce negative ions.
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Dates et versions

hal-04749392 , version 1 (23-10-2024)

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  • HAL Id : hal-04749392 , version 1

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Ryan Magee, Marie-Amandine Pinault-Thaury, Jocelyn Achard, Jean-Marc Layet, Timo Gans, et al.. Measuring negative ion yield and work function from phosphorus doped diamond, boron doped diamond, and graphite in deuterium plasmas. 15th Frontiers in Low Temperature Plasma Diagnostics (FLTPD2024), Apr 2024, Liblice, Czech Republic. ⟨hal-04749392⟩
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