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Mots clés
Acoustic
EPR
Transparent conductive oxide TCO
Stable isotopic tracing
2H
Thin film
Adsorbed layers
Interface defects
Silicon carbide
27Ald p&α
15N
HfO2
Sputtering
Charge exchange
Ageing
17Op
Metal-insulator transition
ALD
17O
RBS
Auger electron spectroscopy AES
Low energy electron diffraction LEED
Aluminum
Ion implantation
Defects
Indium oxide
AFM
XPS
Rutherford backscattering spectrometry RBS
XRD
Measurement
Pulsed laser deposition
Diffusion
SiC
Magnetization curves
Nanoparticles
Oxidation
7630Lh
Topological defects
Raman spectroscopy
Passivation
Epitaxial growth
X-ray diffraction
7550Ee
Density functional theory
Nitridation
18O resonance
17Opp
Gold
AC susceptibility
Alloy
Kossel diffraction
Photoluminescence
Acoustic propreties of solid
Nuclear resonance profiling NRP
Epitaxy
ADSORPTION DESORPTION HYSTERESIS
GaMnAs
Nuclear reaction analysis
Multilayer
18O
Aluminium
Adsorption Isotherms
Capillary condensation
Alloys
27Alda
3C-SiC
6855Jk
Al2O3
Magnetic anisotropy
Nickel
Evaluation
8140Ef
Zinc oxide
NRP
7550Pp
Atomic Layer Deposition ALD
Magnetic semiconductors
Hysteresis
Periodic multilayer
Oxygen deficiency
Adsorption
Thin films
Silica
Ion beam analysis
Topological insulators
Nanostructures
Channeling
27Aldp
Gallium oxide
Silicon
PIXE
Isotopic Tracing
Annealing
Silicon Carbide
Energy loss
Ferromagnetic resonance
Pb centers
Growth
13C